In FIM, a sharp (<50 nm tip radius) metal tip is produced and placed in an ultra high vacuum chamber, which is backfilled with an imaging gas such as helium or neon. The tip is cooled to cryogenic temperatures (20–100 K). A positive voltage of 5000 to 10000 volts is applied to the tip. Gas atoms adsorbed on the tip are ionized by the strong electric field in the vicinity of the tip (thus, "field ionization"), becoming positively charged and being repelled from the tip. The curvature of the surface near the tip causes a natural magnification — ions are repelled in a direction roughly perpendicular to the surface (a "point projection" effect). A detector is placed so as to collect these repelled ions; the image formed from all the collected ions can be of sufficient resolution to image individual atoms on the tip surface.
Unlike conventional microscopes, where the spatial resolution is limited by the wavelength of the particles which are used for imaging, the FIM is a projection type microscope with atomic resolution and an approximate magnification of a few million times.
Patent No. 07601953 Issued on Oct. 13, Assigned to ALIS Corporation for Systems and methods for a gas field ion microscope
Oct 15, 2009; ALEXANDRIA, Va., Sept. 15 -- Billy W. WardLouis S. Farkas, IIIJohn A. Notte, IV, Randall G. Percival, all of Merrimac, NH, have...
WIPO ASSIGNS PATENT TO CARL ZEISS NTS FOR "GAS FIELD ION MICROSCOPES HAVING MULTIPLE OPERATION MODES" (AMERICAN INVENTOR)
Nov 19, 2010; GENEVA, Nov. 20 -- Publication No. WO/2010/132221 was published on Nov. 18. Title of the invention: "GAS FIELD ION MICROSCOPES...