The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests. BIT is an acronym for Built In Test.

The term BIT often includes :-

• The detection of the fault
• The accommodation of the fault (how the system actively responds to the fault)
• The annunciation or logging of the fault to warn of possible effects and/or aid in troubleshooting the faulty equipment.

Functionality

• Analysis of failure monitoring results
• Reporting & Memorization of failures
• Management of tests